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Dr. Michail Papadakis

Michail Papadakis

Associate professor

Faculté ou Centre Interdisciplinary Centre for Security, Reliability and Trust
Department SerVal
Adresse postale Campus Kirchberg, Université du Luxembourg
6, rue Richard Coudenhove-Kalergi
L-1359 Luxembourg
Bureau sur le campus E 005
E-mail
Téléphone (+352) 46 66 44 5672

Michail Papadakis is a Senior Research Scientist in Software Engineering with emphasis on Software Testing. 

Michail received his PhD in Software Testing and Verification, in 2011 at the Athens University of Economics and Business. Since 2012, he has been a Research Associate and since 2016 Research Scientist in SnT. His research focusses on model-driven software engineering, especially software testing, debugging and verification. He has an outstanding scientific record and extensive experience in attracting competitive research funding as PI and co-PI, from the FNR and industrial partners. In addition, he has been actively involved in managing and contributing to those projects.

More details about his research and background can be found on his personal home page.

 

 A-Most 2016         

  Special Theme on Model-Based Testing.

Last updated on: mercredi 23 septembre 2020

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See detailSelecting Fault Revealing Mutants
Titcheu Chekam, Thierry; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Le Traon, Yves; Sen, Koushik

in Empirical Software Engineering (in press)

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2022

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See detailµBert: Mutation Testing using Pre-Trained Language Models
Degiovanni, Renzo Gaston; Papadakis, Mike

in Degiovanni, Renzo Gaston; Papadakis, Mike (Eds.) µBert: Mutation Testing using Pre-Trained Language Models (2022)

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See detailLearning from what we know: How to perform vulnerability prediction using noisy historical data
Garg, Aayush; Degiovanni, Renzo Gaston; Jimenez, Matthieu; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

in Empirical Software Engineering (2022)

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See detailCerebro: Static Subsuming Mutant Selection
Garg, Aayush; Ojdanic, Milos; Degiovanni, Renzo Gaston; Titcheu Chekam, Thierry; Papadakis, Mike; Le Traon, Yves

in IEEE Transactions on Software Engineering (2022)

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See detailOn Evaluating Adversarial Robustness of Chest X-ray Classification: Pitfalls and Best Practices
Ghamizi, Salah; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

in The Thirty-Seventh AAAI Conference on Artificial Intelligence (AAAI- 23) - SafeAI Workshop, Washington, D.C., Feb 13-14, 2023 (2022)

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See detailAdversarial Robustness in Multi-Task Learning: Promises and Illusions
Ghamizi, Salah; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

in Proceedings of the thirty-Sixth AAAI Conference on Artificial Intelligence (AAAI-22) (2022)

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See detailTowards Generalizable Machine Learning for Chest X-ray Diagnosis with Multi-task learning
Ghamizi, Salah; Garcia Santa Cruz, Beatriz; Temple, Paul; Cordy, Maxime; Perrouin, Gilles; Papadakis, Mike; Le Traon, Yves

E-print/Working paper (2022)

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See detailEfficient and Transferable Adversarial Examples from Bayesian Neural Networks
Gubri, Martin; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves; Sen, Koushik

in The 38th Conference on Uncertainty in Artificial Intelligence (2022)

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See detailLGV: Boosting Adversarial Example Transferability from Large Geometric Vicinity
Gubri, Martin; Cordy, Maxime; Papadakis, Mike; Traon, Yves Le; Sen, Koushik

in Computer Vision -- ECCV 2022 (2022)

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See detailAn Empirical Study on Data Distribution-Aware Test Selection for Deep Learning Enhancement
Hu, Qiang; Guo, Yuejun; Cordy, Maxime; Xie, Xiaofei; Ma, Lei; Papadakis, Mike; Le Traon, Yves

in ACM Transactions on Software Engineering and Methodology (2022)

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See detailCODEBERT-NT: code naturalness via CodeBERT
Khanfir, Ahmed; Jimenez, Matthieu; Papadakis, Mike; Le Traon, Yves

in 22nd IEEE International Conference on Software Quality, Reliability and Security (QRS'22) (2022, December 05)

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See detailiBiR: Bug Report driven Fault Injection
Khanfir, Ahmed; Koyuncu, Anil; Papadakis, Mike; Cordy, Maxime; Bissyande, Tegawendé François D Assise; Klein, Jacques; Le Traon, Yves

in ACM Transactions on Software Engineering and Methodology (2022)

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See detailGraphCode2Vec: generic code embedding via lexical and program dependence analyses
Ma, Wei; Zhao, Mengjie; Soremekun, Ezekiel; Hu, Qiang; Zhang, Jie M.; Papadakis, Mike; Cordy, Maxime; Xie, Xiaofei; Traon, Yves Le

in Proceedings of the 19th International Conference on Mining Software Repositories (2022, May 22)

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See detailOn the use of commit-relevant mutants
Ojdanic, Milos; Ma, Wei; Laurent, Thomas; Titcheu Chekam, Thierry; Ventresque, Anthony; Papadakis, Mike

in Empirical Software Engineering (2022), 27

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See detailMutation Testing in Evolving Systems: Studying the relevance of mutants to code evolution
Ojdanic, Milos; Soremekun, Ezekiel; Degiovanni, Renzo Gaston; Papadakis, Mike; Le Traon, Yves

in ACM Transactions on Software Engineering and Methodology (2022)

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2021

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See detailCONFUZZION: A Java Virtual Machine Fuzzer for Type Confusion Vulnerabilities
Bonnaventure, William; Khanfir, Ahmed; Bartel, Alexandre; Papadakis, Mike; Le Traon, Yves

in IEEE International Conference on Software Quality, Reliability, and Security (QRS), 2021 (2021)

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See detailStatistical model checking for variability-intensive systems: applications to bug detection and minimization
Cordy, Maxime; Lazreg, Sami; Papadakis, Mike; Legay, Axel

in Formal Aspects of Computing (2021), 33(6), 1147--1172

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See detailEvasion Attack STeganography: Turning Vulnerability Of Machine Learning ToAdversarial Attacks Into A Real-world Application
Ghamizi, Salah; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

in Proceedings of International Conference on Computer Vision 2021 (2021)

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See detailRequirements And Threat Models of Adversarial Attacks and Robustness of Chest X-ray classification
Ghamizi, Salah; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

E-print/Working paper (2021)

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See detailA Replication Study on the Usability of Code Vocabulary in Predicting Flaky Tests
Haben, Guillaume; Habchi, Sarra; Papadakis, Mike; Cordy, Maxime; Le Traon, Yves

in 18th International Conference on Mining Software Repositories (2021, May)

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See detailTowards Exploring the Limitations of Active Learning: An Empirical Study
Hu, Qiang; Guo, Yuejun; Cordy, Maxime; Xiaofei, Xie; Ma, Wei; Papadakis, Mike; Le Traon, Yves

in The 36th IEEE/ACM International Conference on Automated Software Engineering. (2021)

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See detailTest Selection for Deep Learning Systems
Ma, Wei; Papadakis, Mike; Tsakmalis, Anestis; Cordy, Maxime; Le Traon, Yves

in ACM Transactions on Software Engineering and Methodology (2021), 30(2), 131--1322

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See detailMuDelta: Delta-Oriented Mutation Testing at Commit Time
Ma, Wei; Thierry Titcheu, Chekam; Papadakis, Mike; Harman, Mark

in International Conference on Software Engineering (ICSE) (2021)

See detailSyntactic Vs. Semantic similarity of Artificial and Real Faults in Mutation Testing Studies
Ojdanic, Milos; Garg, Aayush; Khanfir, Ahmed; Degiovanni, Renzo Gaston; Papadakis, Mike; Le Traon, Yves

E-print/Working paper (2021)

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See detailKilling Stubborn Mutants with Symbolic Execution
Titcheu Chekam, Thierry; Papadakis, Mike; Cordy, Maxime; Le Traon, Yves

in ACM Transactions on Software Engineering and Methodology (2021), 30(2), 191--1923

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2020

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See detailStatistical Model Checking for Variability-Intensive Systems
Cordy, Maxime; Papadakis, Mike; Legay, Axel

in FUNDAMENTAL APPROACHES TO SOFTWARE ENGINEERING, Dublin 22-25 April 2020 (2020, April)

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See detailSearch-based adversarial testing and improvement of constrained credit scoring systems
Ghamizi, Salah; Cordy, Maxime; Gubri, Martin; Papadakis, Mike; Boystov, Andrey; Le Traon, Yves; Goujon, Anne

in ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE '20), November 8-13, 2020 (2020)

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See detailFeatureNET: Diversity-driven Generation of Deep Learning Models
Ghamizi, Salah; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

in International Conference on Software Engineering (ICSE) (2020)

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See detailAdversarial Embedding: A robust and elusive Steganography and Watermarking technique
Ghamizi, Salah; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

Scientific Conference (2020)

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See detailPandemic Simulation and Forecasting of exit strategies:Convergence of Machine Learning and EpidemiologicalModels
Ghamizi, Salah; Rwemalika, Renaud; Cordy, Maxime; Le Traon, Yves; Papadakis, Mike

Report (2020)

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See detailData-driven simulation and optimization for covid-19 exit strategies
Ghamizi, Salah; Rwemalika, Renaud; Cordy, Maxime; Veiber, Lisa; Bissyande, Tegawendé François D Assise; Papadakis, Mike; Klein, Jacques; Le Traon, Yves

in Ghamizi, Salah; Rwemalika, Renaud; Cordy, Maxime; Veiber, Lisa; Bissyande, Tegawendé François D Assise; Papadakis, Mike; Klein, Jacques; Le Traon, Yves (Eds.) Data-driven simulation and optimization for covid-19 exit strategies (2020, August)

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See detailCommit-Aware Mutation Testing
Ma, Wei; Laurent, Thomas; Ojdanic, Milos; Titcheu Chekam, Thierry; Ventresque, Anthony; Papadakis, Mike

in IEEE International Conference on Software Maintenance and Evolution (ICSME) (2020)

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See detailAutomatic Testing and Improvement of Machine Translation
Sun, Zeyu; Zhang, Jie; Harman, Mark; Papadakis, Mike; Zhang, Lu

in International Conference on Software Engineering (ICSE) (2020)

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See detailSelecting fault revealing mutants
Titcheu Chekam, Thierry; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Le Traon, Yves; Sen, Koushik

in Empirical Software Engineering (2020)

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See detailMuteria: An Extensible and Flexible Multi-Criteria Software Testing Framework
Titcheu Chekam, Thierry; Papadakis, Mike; Le Traon, Yves

in ACM/IEEE International Conference on Automation of Software Test (AST) 2020 (2020)

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2019

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See detailSearch-based Test and Improvement of Machine-Learning-Based Anomaly Detection Systems
Cordy, Maxime; Muller, Steve; Papadakis, Mike; Le Traon, Yves

in ACM SIGSOFT International Symposium on Software Testing and Analysis (2019)

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See detailAutomated Search for Configurations of Deep Neural Network Architectures
Ghamizi, Salah; Cordy, Maxime; Papadakis, Mike; Le Traon, Yves

in Automated Search for Configurations of Convolutional Neural Network Architectures (2019)

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See detailAn Empirical Study on Vulnerability Prediction of Open-Source Software Releases
Jimenez, Matthieu; Rwemalika, Renaud; Papadakis, Mike; Sarro, Federica; Le Traon, Yves; Harman, Mark

in Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE) (2019)

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See detailThe Importance of Accounting for Real-World Labelling When Predicting Software Vulnerabilities
Jimenez, Matthieu; Rwemalika, Renaud; Papadakis, Mike; Sarro, Federica; Le Traon, Yves; Harman, Mark

in Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE) (2019)

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See detailAssessing Transition-based Test Selection Algorithms at Google
Leong, Claire; Abhayendra, Singh; Papadakis, Mike; Le Traon, Yves; Micco, John

in International Conference on Software Engineering (ICSE) (2019)

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See detailSemantic Fuzzing with Zest
Padhye, Rohan; Lemieux, Caroline; Sen, Koushik; Papadakis, Mike; Le Traon, Yves

in ACM SIGSOFT International Symposium on Software Testing and Analysis (2019)

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See detailMutation Testing Advances: An Analysis and Survey
Papadakis, Mike; Kintis, Marinos; Zhang, Jie; Jia, Yue; Le Traon, Yves; Harman, Mark

in Advances in Computers (2019)

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See detailAn industrial study on the differences between pre-release and post-release bugs
Rwemalika, Renaud; Kintis, Marinos; Papadakis, Mike; Le Traon, Yves; Lorrach, Pierre

in Proceedings of 35th IEEE International Conference on Software Maintenance and Evolution (2019, September 30)

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See detailOn the Evolution of Keyword-Driven Test Suites
Rwemalika, Renaud; Kintis, Marinos; Papadakis, Mike; Le Traon, Yves; Lorrach, Pierre

in 12th IEEE International Conference on Software Testing, Verification and Validation (2019)

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See detailA Replicable Comparison Study of NER Software: StanfordNLP, NLTK, OpenNLP, SpaCy, Gate
Schmitt, Xavier; Kubler, Sylvain; Robert, Jérémy; Papadakis, Mike; Le Traon, Yves

in International Conference on Social Networks Analysis, Management and Security (2019)

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See detailEmpirical Evaluation of Mutation-based Test Prioritization Techniques
Shin, Donghwan; Yoo, Shin; Papadakis, Mike; Bae, Doo-Hwan

in Software Testing, Verification and Reliability (2019), 29(1-2),

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See detailSelecting fault revealing mutants
Titcheu Chekam, Thierry; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Le Traon, Yves; Sen, Koushik

in Empirical Software Engineering (2019)

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See detailMart: A Mutant Generation Tool for LLVM
Titcheu Chekam, Thierry; Papadakis, Mike; Le Traon, Yves

in Titcheu Chekam, Thierry; Papadakis, Mike; Le Traon, Yves (Eds.) Mart: A Mutant Generation Tool for LLVM (2019)

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2018

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See detailA Hybrid Algorithm for Multi-objective Test Case Selection in Regression Testing
Delavernhe, Florian; Saber, Takfarinas; Papadakis, Mike; Ventresque, Anthony

in IEEE CONGRESS ON EVOLUTIONARY COMPUTATION (2018)

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See detailModel-based mutant equivalence detection using automata language equivalence and simulations
Devroey, Xavier; Perrouin, Gilles; Papadakis, Mike; Legay, Axel; Schobbens, Pierre-Yves; Heymans, Pattrick

in Journal of Systems and Software (2018)

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See detailTUNA: TUning Naturalness-based Analysis
Jimenez, Matthieu; Cordy, Maxime; Le Traon, Yves; Papadakis, Mike

in 34th IEEE International Conference on Software Maintenance and Evolution, Madrid, Spain, 26-28 September 2018 (2018, September 26)

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See detailOn the impact of tokenizer and parameters on N-gram based Code Analysis
Jimenez, Matthieu; Cordy, Maxime; Le Traon, Yves; Papadakis, Mike

Scientific Conference (2018, September)

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See detailEnabling the Continous Analysis of Security Vulnerabilities with VulData7
Jimenez, Matthieu; Le Traon, Yves; Papadakis, Mike

in IEEE International Working Conference on Source Code Analysis and Manipulation (2018)

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See detailAre mutants really natural? A study on how “naturalness” helps mutant selection
Jimenez, Matthieu; Titcheu Chekam, Thierry; Cordy, Maxime; Papadakis, Mike; Kintis, Marinos; Le Traon, Yves; Harman, Mark

in Proceedings of 12th International Symposium on 
 Empirical Software Engineering and Measurement (ESEM'18) (2018, October 11)

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See detailHow effective are mutation testing tools? An empirical analysis of Java mutation testing tools with manual analysis and real faults
Kintis, Marinos; Papadakis, Mike; Papadopoulos, Andreas; Valvis, Evangelos; Malevris, Nicos; Le Traon, Yves

in Empirical Software Engineering (2018)

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See detailTime to Clean Your Test Objectives
Marcozzi, Michaël; Bardin, Sébastien; Kosmatov, Nikolai; Papadakis, Mike; Prevosto, Virgile; Correnson, Loïc

in 40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden (2018, May)

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See detailFeature location benchmark for extractive software product line adoption research using realistic and synthetic Eclipse variants
Martinez, Jabier; Ziadi, Tewfik; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Klein, Jacques; Le Traon, Yves

in Information and Software Technology (2018)

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See detailAre Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults
Papadakis, Mike; Shin, Donghwan; Yoo, Shin; Bae, Doo-Hwan

in 40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden (2018)

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See detailMutant Quality Indicators
Papadakis, Mike; Titcheu Chekam, Thierry; Le Traon, Yves

in 13th International Workshop on Mutation Analysis (MUTATION'18) (2018)

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See detailCan we automate away the main challenges of end-to-end testing?
Rwemalika, Renaud; Kintis, Marinos; Papadakis, Mike; Le Traon, Yves

Scientific Conference (2018, December 11)

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See detailPredicting the Fault Revelation Utility of Mutants
Titcheu Chekam, Thierry; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Le Traon, Yves

in 40th International Conference on Software Engineering, Gothenburg, Sweden, May 27 - 3 June 2018 (2018)

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2017

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See detailAutomata Language Equivalence vs. Simulations for Model-based Mutant Equivalence: An Empirical Evaluation
Devroey, Xavier; Perrouin, Gilles; Papadakis, Mike; Legay, Axel; Schobbens, Pierre-Yves; Heymans, Patrick

in 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) (2017)

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See detailOn the Naturalness of Mutants
Jimenez, Matthieu; Cordy, Maxime; Kintis, Marinos; Titcheu Chekam, Thierry; Le Traon, Yves; Papadakis, Mike

E-print/Working paper (2017)

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See detailDetecting Trivial Mutant Equivalences via Compiler Optimisations
Kintis, Marinos; Papadakis, Mike; Jia, Yue; Malevris, Nicos; Le Traon, Yves; Harman, Mark

in IEEE Transactions on Software Engineering (2017)

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See detailAssessing and Improving the Mutation Testing Practice of PIT
Laurent, Thomas; Papadakis, Mike; Kintis, Marinos; Henard, Christopher; Le Traon, Yves; Ventresque, Anthony

in 10th IEEE International Conference on Software Testing, Verification and Validation (2017)

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See detailStatic Analysis of Android Apps: A Systematic Literature Review
Li, Li; Bissyande, Tegawendé François D Assise; Papadakis, Mike; Rasthofer, Siegfried; Bartel, Alexandre; Octeau, Damien; Klein, Jacques; Le Traon, Yves

in Information and Software Technology (2017)

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See detailTowards Security-aware Mutation Testing
Loise, Thomas; Devroey, Xavier; Perrouin, Gilles; Papadakis, Mike; Heymans, Patrick

in The 12th International Workshop on Mutation Analysis (Mutation 2017) (2017)

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See detailAn Empirical Study on Mutation, Statement and Branch Coverage Fault Revelation that Avoids the Unreliable Clean Program Assumption
Titcheu Chekam, Thierry; Papadakis, Mike; Le Traon, Yves; Harman, Mark

in International Conference on Software Engineering (ICSE 2017) (2017, May 28)

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2016

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See detailPIT a Practical Mutation Testing Tool for Java
Coles, Henry; Laurent, Thomas; Henard, Christopher; Papadakis, Mike; Ventresque, Anthony

in International Symposium on Software Testing and Analysis, ISSTA 2016 (2016)

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See detailFeatured model-based mutation analysis
Devroey, Xavier; Perrouin, Gilles; Papadakis, Mike; Legay, Axel; Schobbens, Pierre-Yves; Heymans, Patric

in 38th International Conference on Software Engineering (ICSE'16) (2016)

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See detailComparing White-box and Black-box Test Prioritization
Henard, Christopher; Papadakis, Mike; Harman, Mark; Jia, Yue; Le Traon, Yves

in 38th International Conference on Software Engineering (ICSE'16) (2016)

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See detailProfiling Android Vulnerabilities
Jimenez, Matthieu; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Klein, Jacques

in 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS 2016) (2016, August)

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See detailAn Empirical Analysis of Vulnerabilities in OpenSSL and the Linux Kernel
Jimenez, Matthieu; Papadakis, Mike; Le Traon, Yves

in 2016 Asia-Pacific Software Engineering Conference (APSEC) (2016, December)

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See detailVulnerability Prediction Models: A case study on the Linux Kernel
Jimenez, Matthieu; Papadakis, Mike; Le Traon, Yves

in 16th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2016, Raleigh, US, October 2-3, 2016 (2016, October)

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See detailAnalysing and Comparing the Effectiveness of Mutation Testing Tools: A Manual Study
Kintis, Marinos; Papadakis, Mike; Papadopoulos, Andreas; Valvis, Evangelos; Malevris, Nicos

in International Working Conference on Source Code Analysis and Manipulation (SCAM'16) (2016)

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See detailStatic Analysis of Android Apps: A Systematic Literature Review
Li, Li; Bissyande, Tegawendé François D Assise; Papadakis, Mike; Rasthofer, Siegfried; Bartel, Alexandre; Octeau, Damien; Klein, Jacques; Le Traon, Yves

Report (2016)

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See detailFeature Location Benchmark for Software Families using Eclipse Community Releases
Martinez, Jabier; Ziadi, Tewfik; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Klein, Jacques; Le Traon, Yves

in Software Reuse: Bridging with Social-Awareness, ICSR 2016 Proceedings (2016)

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See detailThreats to the validity of mutation-based test assessment
Papadakis, Mike; Henard, Christopher; Harman, Mark; Jia; Le Traon, Yves

in International Symposium on Software Testing and Analysis, ISSTA 2016 (2016)

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2015

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See detailSound and Quasi-Complete Detection of Infeasible Test Requirements
Bardin, Sebastien; Delahaye, Mickaël; Kosmatov, Nikolai; David, Robin; Papadakis, Mike; Le Traon, Yves; Marion, Jean-Yves

in 8th IEEE International Conference on Software Testing, Verification and Validation (ICST'15) (2015)

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See detailSimilarity testing for access control
Bertolino, A.; Daoudagh, S.; El Kateb, Donia; Henard, Christopher; Le Traon, Yves; Lonetti, F.; Marchetti, E.; Mouelhi, T.; Papadakis, Mike

in Information and Software Technology (2015), 58

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See detailCombining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines
Henard, Christopher; Papadakis, Mike; Harman, Mark; Le Traon, Yves

in 37th International Conference on Software Engineering (ICSE 2015) (2015)

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See detailFlattening or not of the combinatorial interaction testing models
Henard, Christopher; Papadakis, Mike; Le Traon, Yves

in Eighth IEEE International Conference on Software Testing, Verification and Validation, ICST 2015 Workshops (2015, April)

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See detailEmploying second-order mutation for isolating first-order equivalent mutants
Kintis, Marinos; Papadakis, Mike; Malevris, Nicos

in Software Testing, Verification and Reliability (2015), 25(5-7), 508-535

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See detailAssessing and Improving the Mutation Testing Practice of PIT
Laurent, Thomas; Ventresque, Anthony; Papadakis, Mike; Henard, Christopher; Le Traon, Yves

E-print/Working paper (2015)

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See detailMetallaxis-FL: mutation-based fault localization
Papadakis, Mike; Le Traon, Yves

in Software Testing, Verification and Reliability (2015), 25

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See detailTrivial Compiler Equivalence: A Large Scale Empirical Study of a Simple, Fast and Effective Equivalent Mutant Detection Technique
Papadakis, Mike; Yue, Jia; Harman, Mark; Le Traon, Yves

in 37th International Conference on Software Engineering (ICSE 2015) (2015)

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2014

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See detailSimilarity testing for access control
Bertolino, Antonia; daoudagh, said; El Kateb, Donia; Henard, Christopher; Le Traon, Yves; lonetti, francesca; marchetti, eda; Mouelhi, Tejeddine; Papadakis, Mike

in Information and Software Technology (2014)

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See detailTest Data Generation Techniques for Mutation Testing: A Systematic Mapping
Carlos, Francisco; Papadakis, Mike; Durelli, Vinícius; Delamaro, Eduardo Márcio

in Workshop on Experimental Software Engineering (ESELAW'14) (2014)

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See detailA Variability Perspective of Mutation Analysis
Devroey, Xavier; Perrouin, Gilles; Cordy, Maxime; Papadakis, Mike; Legay, Axel; Schobbens, Pierre-Yves

in Proceedings of the 22nd ACM SIGSOFT International Symposium on the Foundations of Software Engineering (FSE 2014) (2014)

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See detailMutation-based Generation of Software Product Line Test Configurations
Henard, Christopher; Papadakis, Mike; Le Traon, Yves

in Symposium on Search-Based Software Engineering (SSBSE 2014) (2014)

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See detailMutaLog: a Tool for Mutating Logic Formulas
Henard, Christopher; Papadakis, Mike; Le Traon, Yves

in Testing Tools Track, 7th International Conference on Software Testing, Verification and Validation (ICST 2014) (2014)

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See detailBypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Configurations for Software Product Lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Heymans, Patrick; Le Traon, Yves

in IEEE Transactions on Software Engineering (2014), 40(7), 650-670

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See detailMitigating the Effects of Equivalent Mutants with Mutant Classification Strategies
Papadakis, Mike; Delamaro, Eduardo Márcio; Le Traon, Yves

in Science of Computer Programming (2014), 95

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See detailSampling Program Inputs with Mutation Analysis: Going Beyond Combinatorial Interaction Testing
Papadakis, Mike; Henard, Christopher; Le Traon, Yves

in 7th International Conference on Software Testing, Verification and Validation (ICST 2014) (2014)

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See detailEffective Fault Localization via Mutation Analysis: A Selective Mutation Approach
Papadakis, Mike; Le Traon, Yves

in ACM Symposium On Applied Computing (SAC'14) (2014)

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See detailTowards a Language-Independent Approach for Reverse-Engineering of Software Product Lines
Ziadi, Tewfik; Henard, Christopher; Papadakis, Mike; Ziane, Mikal; Le Traon, Yves

in 29th Symposium on Applied Computing (SAC 2014) (2014)

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2013

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See detailAssessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013 (2013)

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See detailMulti-objective test generation for software product lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in 17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013 (2013)

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See detailTowards automated testing and fixing of re-engineered feature models
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in Proceedings of the 2013 International Conference on Software Engineering (2013)

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See detailPLEDGE: a product line editor and test generation tool
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in 17th International Software Product Line Conference co-located workshops, SPLC 2013 workshops, Tokyo, Japan - August 26 (2013)

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See detailTesting Delegation Policy Enforcement via Mutation Analysis
Nguyen, Phu Hong; Papadakis, Mike; Rubab, Iram

in 7th International Workshop on Mutation Analysis (2013, March)

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See detailProteum/FL: A tool for localizing faults using mutation analysis.
Papadakis, Mike; Delamaro, Eduardo Márcio; Le Traon, Yves

in International Working Conference on Source Code Analysis and Manipulation (2013)

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See detailMutation Testing Strategies using Mutant Classification
Papadakis, Mike; Le Traon, Yves

in Abstract book of 28th Symposium On Applied Computing (2013)

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2012

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See detailBypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Heymans, Patrick; Le Traon, Yves

Report (2012)

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See detailIsolating First Order Equivalent Mutants via Second Order Mutation.
Kintis, Marinos; Papadakis, Mike; Malevris, Nicos

in ICST 2012 (2012)

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See detailUsing Mutants to Locate "Unknown" Faults
Papadakis, Mike; Le Traon, Yves

in ICST 2012 (2012)

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See detailMutation Based Test Case Generation via a Path Selection Strategy
Papadakis, Mike; Malevris, Nicos

in Information and Software Technology (2012), 54(9), 915-932

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