Michail Papadakis

Michail Papadakis

Adjoint de recherche

Faculté ou Centre Faculté des Sciences, de la Technologie et de la Communication
Unité de recherche CSC
Adresse postale Université du Luxembourg
29, avenue JF Kennedy
L-1855 Luxembourg
Bureau sur le campus JFK Building, E02-205
E-mail
Téléphone (+352) 46 66 44 5672

I am a research associate in the Serval group of the Interdisciplinary Centre for Security, Reliability and Trust ( SnT ) at the  University of Luxembourg.

My research focuses on software testing and software debugging.

More details about my research and background can be found on  my personal home page.

 

 A-Most 2016         

  Special Theme on Model-Based Testing.

Last updated on: dimanche, 01 novembre 2015

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2017

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See detailAutomata Language Equivalence vs. Simulations for Model-based Mutant Equivalence: An Empirical Evaluation
Devroey, Xavier; Perrouin, Gilles; Papadakis, Mike; Legay, Axel; Schobbens, Pierre-Yves; Heymans, Patrick

in 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) (2017)

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See detailDetecting Trivial Mutant Equivalences via Compiler Optimisations
Kintis, Marinos; Papadakis, Mike; Jia, Yue; Malevris, Nicos; Le Traon, Yves; Harman, Mark

in IEEE Transactions on Software Engineering (2017)

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See detailAssessing and Improving the Mutation Testing Practice of PIT
Laurent, Thomas; Papadakis, Mike; Kintis, Marinos; Henard, Christopher; Le Traon, Yves; Ventresque, Anthony

in 10th IEEE International Conference on Software Testing, Verification and Validation (2017)

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See detailStatic Analysis of Android Apps: A Systematic Literature Review
Li, Li; Bissyande, Tegawendé François D Assise; Papadakis, Mike; Rasthofer, Siegfried; Bartel, Alexandre; Octeau, Damien; Klein, Jacques; Le Traon, Yves

in Information and Software Technology (2017)

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See detailTowards Security-aware Mutation Testing
Loise, Thomas; Devroey, Xavier; Perrouin, Gilles; Papadakis, Mike; Heymans, Patrick

in The 12th International Workshop on Mutation Analysis (Mutation 2017) (2017)

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See detailMutation Testing Advances: An Analysis and Survey
Papadakis, Mike; Kintis, Marinos; Zhang, Jie; Jia, Yue; Le Traon, Yves; Harman, Mark

in Advances in Computers (2017)

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See detailAn Empirical Study on Mutation, Statement and Branch Coverage Fault Revelation that Avoids the Unreliable Clean Program Assumption
Titcheu Chekam, Thierry; Papadakis, Mike; Le Traon, Yves; Harman, Mark

in International Conference on Software Engineering (ICSE 2017) (2017, May 28)

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2016

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See detailPIT a Practical Mutation Testing Tool for Java
Coles, Henry; Laurent, Thomas; Henard, Christopher; Papadakis, Mike; Ventresque, Anthony

in International Symposium on Software Testing and Analysis, ISSTA 2016 (2016)

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See detailFeatured model-based mutation analysis
Devroey, Xavier; Perrouin, Gilles; Papadakis, Mike; Legay, Axel; Schobbens, Pierre-Yves; Heymans, Patric

in 38th International Conference on Software Engineering (ICSE'16) (2016)

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See detailComparing White-box and Black-box Test Prioritization
Henard, Christopher; Papadakis, Mike; Harman, Mark; Jia, Yue; Le Traon, Yves

in 38th International Conference on Software Engineering (ICSE'16) (2016)

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See detailProfiling Android Vulnerabilities
Jimenez, Matthieu; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Klein, Jacques

in 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS 2016) (2016, August)

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See detailAn Empirical Analysis of Vulnerabilities in OpenSSL and the Linux Kernel
Jimenez, Matthieu; Papadakis, Mike; Le Traon, Yves

in 2016 Asia-Pacific Software Engineering Conference (APSEC) (2016, December)

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See detailVulnerability Prediction Models: A case study on the Linux Kernel
Jimenez, Matthieu; Papadakis, Mike; Le Traon, Yves

in 16th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2016, Raleigh, US, October 2-3, 2016 (2016, October)

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See detailAnalysing and Comparing the Effectiveness of Mutation Testing Tools: A Manual Study
Kintis, Marinos; Papadakis, Mike; Papadopoulos, Andreas; Valvis, Evangelos; Malevris, Nicos

in International Working Conference on Source Code Analysis and Manipulation (SCAM'16) (2016)

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See detailStatic Analysis of Android Apps: A Systematic Literature Review
Li, Li; Bissyande, Tegawendé François D Assise; Papadakis, Mike; Rasthofer, Siegfried; Bartel, Alexandre; Octeau, Damien; Klein, Jacques; Le Traon, Yves

Report (2016)

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See detailFeature Location Benchmark for Software Families using Eclipse Community Releases
Martinez, Jabier; Ziadi, Tewfik; Papadakis, Mike; Bissyande, Tegawendé François D Assise; Klein, Jacques; Le Traon, Yves

in Software Reuse: Bridging with Social-Awareness, ICSR 2016 Proceedings (2016)

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See detailThreats to the validity of mutation-based test assessment
Papadakis, Mike; Henard, Christopher; Harman, Mark; Jia; Le Traon, Yves

in International Symposium on Software Testing and Analysis, ISSTA 2016 (2016)

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2015

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See detailSound and Quasi-Complete Detection of Infeasible Test Requirements
Bardin, Sebastien; Delahaye, Mickaël; Kosmatov, Nikolai; David, Robin; Papadakis, Mike; Le Traon, Yves; Marion, Jean-Yves

in 8th IEEE International Conference on Software Testing, Verification and Validation (ICST'15) (2015)

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See detailSimilarity testing for access control
Bertolino, A.; Daoudagh, S.; El Kateb, Donia; Henard, Christopher; Le Traon, Yves; Lonetti, F.; Marchetti, E.; Mouelhi, T.; Papadakis, Mike

in Information and Software Technology (2015), 58

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See detailCombining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines
Henard, Christopher; Papadakis, Mike; Harman, Mark; Le Traon, Yves

in 37th International Conference on Software Engineering (ICSE 2015) (2015)

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See detailFlattening or not of the combinatorial interaction testing models
Henard, Christopher; Papadakis, Mike; Le Traon, Yves

in Eighth IEEE International Conference on Software Testing, Verification and Validation, ICST 2015 Workshops (2015, April)

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See detailEmploying second-order mutation for isolating first-order equivalent mutants
Kintis, Marinos; Papadakis, Mike; Malevris, Nicos

in Software Testing, Verification & Reliability (2015), 25(5-7), 508-535

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See detailAssessing and Improving the Mutation Testing Practice of PIT
Laurent, Thomas; Ventresque, Anthony; Papadakis, Mike; Henard, Christopher; Le Traon, Yves

E-print/Working paper (2015)

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See detailMetallaxis-FL: mutation-based fault localization
Papadakis, Mike; Le Traon, Yves

in Software Testing : Verification & Reliability (2015), 25

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See detailTrivial Compiler Equivalence: A Large Scale Empirical Study of a Simple, Fast and Effective Equivalent Mutant Detection Technique
Papadakis, Mike; Yue, Jia; Harman, Mark; Le Traon, Yves

in 37th International Conference on Software Engineering (ICSE 2015) (2015)

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2014

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See detailSimilarity testing for access control
Bertolino, Antonia; daoudagh, said; El Kateb, Donia; Henard, Christopher; Le Traon, Yves; lonetti, francesca; marchetti, eda; Mouelhi, Tejeddine; Papadakis, Mike

in Information and Software Technology (2014)

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See detailTest Data Generation Techniques for Mutation Testing: A Systematic Mapping
Carlos, Francisco; Papadakis, Mike; Durelli, Vinícius; Delamaro, Eduardo Márcio

in Workshop on Experimental Software Engineering (ESELAW'14) (2014)

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See detailA Variability Perspective of Mutation Analysis
Devroey, Xavier; Perrouin, Gilles; Cordy, Maxime; Papadakis, Mike; Legay, Axel; Schobbens, Pierre-Yves

in Proceedings of the 22nd ACM SIGSOFT International Symposium on the Foundations of Software Engineering (FSE 2014) (2014)

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See detailMutaLog: a Tool for Mutating Logic Formulas
Henard, Christopher; Papadakis, Mike; Le Traon, Yves

in Testing Tools Track, 7th International Conference on Software Testing, Verification and Validation (ICST 2014) (2014)

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See detailMutation-based Generation of Software Product Line Test Configurations
Henard, Christopher; Papadakis, Mike; Le Traon, Yves

in Symposium on Search-Based Software Engineering (SSBSE 2014) (2014)

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See detailBypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Configurations for Software Product Lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Heymans, Patrick; Le Traon, Yves

in IEEE Transactions on Software Engineering (2014), 40(7), 650-670

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See detailMitigating the Effects of Equivalent Mutants with Mutant Classification Strategies
Papadakis, Mike; Delamaro, Eduardo Márcio; Le Traon, Yves

in Science of Computer Programming (2014), 95

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See detailSampling Program Inputs with Mutation Analysis: Going Beyond Combinatorial Interaction Testing
Papadakis, Mike; Henard, Christopher; Le Traon, Yves

in 7th International Conference on Software Testing, Verification and Validation (ICST 2014) (2014)

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See detailEffective Fault Localization via Mutation Analysis: A Selective Mutation Approach
Papadakis, Mike; Le Traon, Yves

in ACM Symposium On Applied Computing (SAC'14) (2014)

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See detailTowards a Language-Independent Approach for Reverse-Engineering of Software Product Lines
Ziadi, Tewfik; Henard, Christopher; Papadakis, Mike; Ziane, Mikal; Le Traon, Yves

in 29th Symposium on Applied Computing (SAC 2014) (2014)

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2013

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See detailPLEDGE: a product line editor and test generation tool
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in 17th International Software Product Line Conference co-located workshops, SPLC 2013 workshops, Tokyo, Japan - August 26 (2013)

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See detailAssessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013 (2013)

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See detailMulti-objective test generation for software product lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in 17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013 (2013)

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See detailTowards automated testing and fixing of re-engineered feature models
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Le Traon, Yves

in Proceedings of the 2013 International Conference on Software Engineering (2013)

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See detailTesting Delegation Policy Enforcement via Mutation Analysis
Nguyen, Phu Hong; Papadakis, Mike; Rubab, Iram

in 7th International Workshop on Mutation Analysis (2013, March)

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See detailProteum/FL: A tool for localizing faults using mutation analysis.
Papadakis, Mike; Delamaro, Eduardo Márcio; Le Traon, Yves

in International Working Conference on Source Code Analysis and Manipulation (2013)

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See detailMutation Testing Strategies using Mutant Classification
Papadakis, Mike; Le Traon, Yves

in Abstract book of 28th Symposium On Applied Computing (2013)

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2012

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See detailBypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles; Klein, Jacques; Heymans, Patrick; Le Traon, Yves

Report (2012)

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See detailIsolating First Order Equivalent Mutants via Second Order Mutation.
Kintis, Marinos; Papadakis, Mike; Malevris, Nicos

in ICST 2012 (2012)

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See detailUsing Mutants to Locate "Unknown" Faults
Papadakis, Mike; Le Traon, Yves

in ICST 2012 (2012)

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See detailMutation Based Test Case Generation via a Path Selection Strategy
Papadakis, Mike; Malevris, Nicos

in Information & Software Technology (2012), 54(9), 915-932

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